Failure-Oriented-Accelerated-Testing and its Possible Application in Ergonomics

Failure-oriented-accelerated-testing (FOAT) has been suggested as part of the probabilistic-design-forreliability (PDfR) concept several years ago in application to microelectronics reliability assurance. It has been argued that when reliability of a material or a device is critical, it has to be quantified to be assured, and, because nothing is perfect, such a quantification should be done on the probabilistic basis.

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